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Zynq System-on-Chip (SoC) integrates both Processor and Programmable Logic architectures, where the whole functionality of a system is placed on a single chip. Due to the advancement of process technology, the complexity of circuit analysis becomes harder and the failure modes are becoming marginal, e.g., leakage in nano-ampere range. SoC devices require very challenging work for failure localization...
As the applications of micro electronic mechanical system (MEMS) are booming, more and more research and development activities are involved in the MEMS industry. For every new MEMS product with new functions, the manufacturing process will be tailored to cope with the changes. This requires reliability work to ensure the robustness of the new process. Thus, failure analysis plays an important role...
In this paper, a method to detect shorts at the gates of the storage node of a 6T SRAM bit cell via atomic force probing (AFP) at the Via 1 level is discussed. This method is useful for the preservation of physical evidence as well as to ease the probing operation due to the lower density and larger separations of vias compared to contacts. One particular case of single bit failure is documented,...
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