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The measurement complex based on the cryostat Janis CCS-400/204N that allows making measurements in vacuum in temperature range 7–500 K is described. Thus a high sensitive measurement complex is developed to investigate noise power spectral density in the frequency range 10−3–104 Hz, temperature range 7–500 K and DC voltage range at samples 0–50 V.
Noise properties of the thin films (Ge2Sb2Te5)1−xBix were investigated. Changing the amorphous film on the crystal structure was carried out by varying the voltage to 10 V on the resistor sample in the isothermal conditions at the constant temperature. The temperature varied from 290 to 420 K with 10 K increasing step. It has been shown that introduction of Bi influences the properties of the phase...
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