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Electromigration (EM) strongly decreases the reliability of micro-electronics interconnects and becomes more problematic as scaling continues. Remedial measures are required, but therefore EM mechanisms first have to be understood. The standard, accelerated EM test methods are time-consuming, destructive and provide only limited physical understanding. We demonstrate that low-frequency (LF) noise...
We report on experiments performed in order to verify the ability of low frequency noise measurements to serve as a sensitive tool for the characterization of the degradation of electron devices on flexible substrates as a consequence of mechanical stress. We designed and build a dedicated stress chamber for performing stress (repeated bending) in controlled environmental conditions. Test devices...
Flicker noise (1/f-like noise) is often used to assess the quality of various materials and devices. This phenomenon has been observed in different electrochemical devices or reactions (e.g., smart windows, pitting corrosion events). In our exploratory studies we consider how to measure and utilize 1/f noise for the quality assessment of supercapacitors. This task requires special attention because...
Nitride technologies are widely used for high frequency and high power electronics, and raise a growing interest for robust low noise receivers. However, the stability of DC and RF performances are difficult to achieve, at a cost of technological trade-offs. Among the problems not totally mastered, traps and charges located in the active regions of the transistor induce a large variety of electrical...
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