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The standard application of atomic force microscope (AFM) is observation with subnanometer resolution. As development of nano-tech, AFM has also become popular as a simple manipulation tool. We have proved that developing a haptic user interface (HUI) can significantly improve these functions of AFM. When going on observation, under the assistance of HUI, the user can not only observe surface characters...
Quantitative friction measurement of nano materials in atomic force microscope (AFM) requires accurate calibration method for the lateral force. An improved calibration method for the lateral force of the cantilever in AFM is presented. The calibration factor derived from the original method increased with the applied normal load, which indicates that separate calibration should be required for every...
Ideally the atomic force microscope (AFM) provides three-dimensional structure of surfaces at high resolution. Nevertheless, there are some requirements for work with biological specimens which should be taken into consideration in the design of an AFM. And a key requirement is that the AFM should be capable of scanning over relatively large areas. In this paper we introduce an experimental AFM head...
A comparative study of the micro-tribological properties of silicon-based component and octadecyltrichlorosilane (OTS) molecular lubricant film which was prepared on Si(100) substrate, and their adhesive and tribological properties were mainly investigated by AFM/LFM. Meanwhile, the effect of relative humidity and scanning velocity was taken into consideration. The results show that the adhesive force...
Tapping-mode atomic force microscope (TM-AFM) is currently the most widely utilized instrument for atomic-resolution imaging and nano-manipulation. However, the complex cantilever-tip dynamics has not been fully understood due to the inherent nonlinear property of tip-sample interaction. Experiments and analytical techniques are two basic methods to investigate the nonlinear effects, but they are...
This paper focuses on nano-scale analysis of mechanical properties of polymer and carbon nanotubes (CNT) embedded MEMS devices using the probe tip of the atomic force microscope (AFM). The mechanical properties of surfaces of layered materials were investigated by using nanoindentation produced with tips of an AFM. Experiment results indicated the bending characteristics of the device and could also...
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