Intel architecture scales from Exa-scale computing to hand-held and deeply embedded devices. A consistent architecture spanning many product domains brings benefits to silicon and product developers. But it also creates a validation challenge that is nonlinear in nature due to the differences in product complexity, use cases, and user expectations. In this talk, John will address how Intel views the reliability/resilience of large scale systems, how we test for user experience that might help users decide what is good for them, how we attempt to balance all the conflicting validation requirements in today's rapidly evolving landscape spanning consumption devices with short life spans to enterprise applications with very high uptime and reliability expectations. In addition, he will comment on the developments in formal methods and their applicability to large-scale commercial validation/verification efforts.
Financed by the National Centre for Research and Development under grant No. SP/I/1/77065/10 by the strategic scientific research and experimental development program:
SYNAT - “Interdisciplinary System for Interactive Scientific and Scientific-Technical Information”.