A double layer SiNx stack shows a better performance compared to conventional single layer SiNx ARC on monocrystalline silicon cells. The double layer SiNx ARC shows a lower reflectivity in the wavelength range of 350-500nm than single layer SiNx, which is quite beneficial to the high sheet resistance emitters featuring good blue spectrum response. In this experiment, the solar cells have a traditional structure with optimized homogenous emitters (HE) having a sheet resistance of 75Ω/sq. Well controlled screen-printing and firing conditions have led to a fill factor up to 79.0% and efficiency up to 18.9% on monocrystalline solar cells, and demonstrated a 0.5% efficiency gain compared to baseline solar cells with single layer SiNx ARC. In comparison to the single layer ARC, there is an increase of 2.8mV in Voc and 0.4mA/cm2 in Jsc. Furthermore, the fill factor is improved due to the fact that the screen-printed fingers show a better profile on the double layer ARCs’ cells.