International Journal of Applied Mathematics and Computer Science > 2014 > 24 > 2 > 271-282
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journal ISSN : | 1641-876X |
journal e-ISSN : | 2083-8492 |
DOI | 10.2478/amcs-2014-0020 |
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Bibliography
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Aminian, F. and Aminian, M. (2001). Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor, Journal of Electronic Testing 17(1): 29-36.
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Anand, G. (2012). Application of artificial neural networks in electrical machines: An overview, World Academy of Science, Engineering and Technology 6(6): 384-385.
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Ben Hamida, N. and Kaminska, B. (1993). Multiple fault analog circuit testing by sensitivity analysis, Journal of Electronic Testing 4(4): 331-343.