Metrology and Measurement Systems
Metrology and Measurement Systems > 2001 > Vol. 8, nr 1 > 91-107
Metrology and Measurement Systems > 2001 > Vol. 8, nr 1 > 63-73
Metrology and Measurement Systems > 2001 > Vol. 8, nr 1 > 3-23
Metrology and Measurement Systems > 2001 > Vol. 8, nr 2 > 113-143
Metrology and Measurement Systems > 2001 > Vol. 8, nr 2 > 165-177
Metrology and Measurement Systems > 2001 > Vol. 8, nr 2 > 179-186
Metrology and Measurement Systems > 2001 > Vol. 8, nr 2 > 187-195
Metrology and Measurement Systems > 2001 > Vol. 8, nr 2 > 145-152
Metrology and Measurement Systems > 2001 > Vol. 8, nr 2 > 153-163
Metrology and Measurement Systems > 2001 > Vol. 8, nr 2 > 197-211
Metrology and Measurement Systems > 2001 > Vol. 8, nr 3 > 251-262
Metrology and Measurement Systems > 2001 > Vol. 8, nr 3 > 263-270
Metrology and Measurement Systems > 2001 > Vol. 8, nr 3 > 239-250
Metrology and Measurement Systems > 2001 > Vol. 8, nr 3 > 215-237
Metrology and Measurement Systems > 2001 > Vol. 8, nr 4 > 337-355
Metrology and Measurement Systems > 2001 > Vol. 8, nr 4 > 321-336
Metrology and Measurement Systems > 2001 > Vol. 8, nr 4 > 303-320
Metrology and Measurement Systems > 2001 > Vol. 8, nr 4 > 357-365
Metrology and Measurement Systems > 2002 > Vol. 9, nr 1 > 45-53
Metrology and Measurement Systems > 2002 > Vol. 9, nr 1 > 31-44