International Journal of Electronics and Telecommunications > 2018 > Vol. 64, No. 1 > 83--89
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journal e-ISSN : | 2300-1933 |
DOI | 10.24425/118150 |
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Bibliography
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[2] S. Bhunia, A. Raychowdhury, K. Roy, (2005). Defect oriented testing of analog circuits using wavelet analysis of dynamic supply current. J. Electron Test., 21: 147-159. doi: 10.1007/s10836-005-6144-3.
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[3] M. Catelani, A. Fort, “Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks”, IEEE Trans. Instrum. Measur., vol. 51, pp. 196-202, 2002. doi: 10.1109/19.997811.