Transmission Electron Microscopy (TEM) and its mutation Scanning Transmission Electron Microscopy (STEM) is one of the most important methods providing unique information on structure and chemistry of solid catalysts at length scale down to level. The principal reason is its high spatial resolution (below 0.1 nm) but also universality, i.e., ability of observation of both images and diffraction patterns of individual nanometer size objects. Recent advances in TEM in particular application of image and beam correctors, possibility of studying specimens at non vacuum conditions (environmental TEM) and possibility of dynamic (time resolved) studies even further broadened the applicability of the method in catalysis.
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