Search results for: C. Merckling
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 444 - 455
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.10