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Synthetic Test Circuit (STC) system for thyristor valve of current-type High Voltage Direct Current (HVDC) typically consists of a low-voltage high-current and a high-voltage low-current source. In order to provide the isolation between each source, auxiliary valve should be inserted, and its voltage and current ratings are greater or equal to those of the test thyristor valve. To ensure the turnoff...
Heavy ion data for custom SRAMs fabricated in a 45-nm CMOS technology demonstrate the effects of N- and P-well contact densities on single-event latchup. Although scaling has improved latchup robustness, process-level immunity has not been achieved, indicating a continued need for latchup mitigation techniques. A simple, algorithmic approach for selecting N- and P-well contact densities is described...
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