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Technology scaling in modern day microelectronics has introduced characteristics and limitations that impacted radiation testing and modeling to the point that rendered traditional methods and practices obsolete in many cases. There is a need to rethink test methodologies, procedures and models in order to predict the true behavior of these technologies in space. In this paper we hope to highlight...
An advanced 0.13 μm SOI Microprocessor was tested for its sensitivity to heavy ions and protons, and compared with a previous generation 0.18 μm version tested with the same methodology. Even though the overall error rates were somewhat comparable, the 0.13 μm version experienced a significantly higher frequency of processor functional error lock-up (hang).
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