Search results for: D. H. Kim
2013 IEEE International Electron Devices Meeting > 2.6.1 - 2.6.4
2013 IEEE International Electron Devices Meeting > 2.1.1 - 2.1.4
2013 IEEE International Electron Devices Meeting > 16.3.1 - 16.3.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
2012 International Electron Devices Meeting > 32.2.1 - 32.2.4