Search results for: S. Gupta
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 360 - 369
Procedia Computer Science > 2015 > 70 > C > 476-482
IEEE Electron Device Letters > 2013 > 34 > 3 > 384 - 386
IEEE Transactions on Computers > 2011 > 60 > 1 > 35 - 49
2010 International Electron Devices Meeting > 27.5.1 - 27.5.4
2009 IEEE International Reliability Physics Symposium > 1023 - 1027