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Silent Data Corruption (SDC) is a serious reliability issue in many domains, including embedded systems. However, current protection techniques are brittle, and do not allow programmers to trade off performance for SDC coverage. Further, many of them require tens of thousands of fault injection experiments, which are highly time-intensive. In this paper, we propose an empirical model to predict the...
This paper proposes a pair of quantitative metrics, namely the idle-to-power ratio (IPR) and the linear deviation ratio (LDR), to be used together for measuring the energy proportionality of computing systems. The metrics are applied to the publicly available SPECPower_ssj2008 benchmark results, yielding a partly grim trend of energy proportionality, which has to be addressed and possibly rectified...
With growing semiconductor integration, the reliability of individual transistors is expected to rapidly decline in future technology generations. In such a scenario, processors would need to be equipped with fault tolerance mechanisms to tolerate in-field silicon defects. Periodic online testing is a popular technique to detect such failures; however, it tends to impose a heavy testing penalty. In...
Functional verification (namely early verification of multimedia processing capabilities) is one of the main challenges in developing SoC-based products, such as consumer electronic devices and portables that incorporate complex audio and video interfaces. Due to rising design complexity, increasingly intricate hardware/software interactions and rising demand for lower power operation are putting...
Widespread emergence of multicore processors will spur development of parallel applications, exposing programmers to degrees of hardware concurrency hitherto unavailable. Dependable multithreaded software will have to rely on the ability to dynamically detect non-deterministic and notoriously hard to reproduce synchronization bugs manifested through data races. Previous solutions to dynamic data race...
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