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Carbon nitride films were synthesized by hot filament assisted plasma sputtering. These films were characterized by scanning electron microscopy (SEM), Auger electron spectroscopy (AES), X-ray diffraction (XRD), Raman spectrometry, and FTIR absorption spectra. The largest N to C atomic ratio obtained from AES was 21 at%. Raman bands at low frequency confirmed the existence of β-C 3 N 4...
Germanium nanocrystals (nc-Ge) embedded in SiO 2 glassy matrix have been prepared on glass substrates and silicon (100) wafers by an rf cosputtering technique and post-annealing treatment in vacuum atmosphere. Using Raman spectrometry, X-ray diffraction, and UV/VIS/NIR transmittance and reflectance measurements, we have investigated the structures and the optical properties of the Ge-SiO ...
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