Search results for: L. Liu
Microelectronics Reliability > 2017 > 71 > Complete > 106-110
Eksploatacja i Niezawodność > 2015 > Vol. 17, no. 1 > 100--106
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 9 - 12
IEEE Transactions on Applied Superconductivity > 2013 > 23 > 3-2 > 5600704