Search results for: F. Saigne
Microelectronics Reliability > 2017 > 76-77 > C > 650-654
Microelectronics Reliability > 2017 > 76-77 > C > 644-649
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 427 - 433
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2065 - 2071
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2673 - 2678
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2620 - 2626
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3389 - 3394
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3380 - 3388
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2930 - 2935
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3043 - 3049
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1747 - 1754
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1603 - 1610
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1414 - 1419