Search results for: Alessio Griffoni
Microelectronics Reliability > 2014 > 54 > 6-7 > 1143-1149
IEEE Transactions on Nuclear Science > 2013 > 60 > 3-2 > 1970 - 1991
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 589 - 598
EOS/ESD Symposium Proceedings > 1 - 8
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 338 - 346