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We report on measurements of phase noise dynamics of microwave beat notes observed in low repetition rate silicon nitride based Kerr-comb generators and relate them to results from dispersion simulations and measurements.
We present a simple method that enables fast, broadband spectroscopy at sub-Megahertz resolution over >4 THz bandwidth using a mode-hop-free tunable diode laser and a frequency comb. This scheme is utilized to measure microresonator dispersion.
The development of high finesse resonators for broadband frequency combs enabled the extension of the versatile frequency comb technique into the extreme ultraviolet with all its implications. We describe new developments in this field.
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