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A 12-bit 32nm SOI CMOS pipeline ADC clocked at 200 MSps was tested at LBNL with the MilliBeam™ technique and showed no upsets with LET up to 30.9 MeV·cm2/mg (Kr), while 1-sample SETs up to 600 LSB in amplitude were observed with broad-beam exposure at TAMU with 0°, 60° incidence angles (Xe and Au), and LET up to 170 MeVcm2/mg.
MSP430FR55739 tests at the Lawrence Berkeley National Laboratory (LBNL) Cyclotron used the Milli-Beam apparatus to restrict exposure to specific blocks. Instruction lockstep techniques were employed to synchronize test unit outputs with an unexposed device. In this paper, we present cross-sections for the device and functional blocks.
Inorganically driven fouling of metal heat-transfer surfaces employed in crude oil refining operations is not well understood. The object of this study is twofold: First, we systematically elucidate the time-dependent mechanism of the interrelated carbonaceous and sulfidic build up that occurs at high temperatures on a metal surface (540°C metal temperature, 250°C oil bath temperature). Second, we...
Pulsed laser light has been used to reveal how total ionizing dose radiation affects the propagation of single event transients in a string of inverters. By holding the input to the string of inverters at high voltage (1.8 V) during exposure to ionizing radiation, an asymmetry in the threshold voltages of the n-channel transistors is induced, i.e., the inputs to the inverters alternate between high...
Recently, there has been considerable interest in the propagation of Single Event Transients (SETs) in both linear bipolar and digital CMOS circuits. [1,2,3,4,5] SETs appear at the outputs of these circuits as momentary glitches that, if sufficiently large and of sufficient duration, can be latched into follow-on circuitry and lead to system errors that are potentially catastrophic if not properly...
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