Search results for: William N. Gill
2015 IEEE International Reliability Physics Symposium > BD.4.1 - BD.4.6
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1745 - 1749
Journal of Materials Science: Materials in Electronics > 2012 > 23 > 1 > 48-55
IEEE Transactions on Electron Devices > 2011 > 58 > 12 > 4354 - 4360
Thin Solid Films > 2009 > 517 > 19 > 5630-5633
Thin Solid Films > 2007 > 515 > 11 > 4794-4800
Journal of Non-Crystalline Solids > 2004 > 350 > Complete > 336-344
Thin Solid Films > 2004 > 449 > 1-2 > 192-206
Thin Solid Films > 2002 > 414 > 1 > 78-90
Thin Solid Films > 2001 > 385 > 1-2 > 281-292
Journal of Non-Crystalline Solids > 2000 > 275 > 3 > 210-215
Thin Solid Films > 2000 > 366 > 1-2 > 181-190
Journal of Membrane Science > 1998 > 141 > 2 > 245-254
Journal of Crystal Growth > 1997 > 179 > 1-2 > 263-276
Journal of Membrane Science > 1996 > 114 > 1 > 39-50
Desalination > 1996 > 104 > 3 > 239-249
Journal of Membrane Science > 1996 > 109 > 2 > 205-217
Journal of Membrane Science > 1994 > 97 > 231-249