Search results for: H. Chen
Electronics Letters > 2017 > 53 > 20 > 1373 - 1375
Journal of Microelectromechanical Systems > 2017 > 26 > 4 > 829 - 836
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
2016 IEEE International Electron Devices Meeting (IEDM) > 35.4.1 - 35.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 14.4.1 - 14.4.4
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1360
Thin Solid Films > 2014 > 557 > C > 376-381
2013 IEEE International Electron Devices Meeting > 2.6.1 - 2.6.4
IEEE Electron Device Letters > 2013 > 34 > 4 > 541 - 543