Search results for: Chao Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-7.1 - PM-7.4
IEEE Electron Device Letters > 2014 > 35 > 12 > 1227 - 1229
IEEE Electron Device Letters > 2012 > 33 > 12 > 1711 - 1713
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 2 > 315 - 324
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 945 - 952
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1620 - 1627
IEEE Transactions on Semiconductor Manufacturing > 2010 > 23 > 3 > 391 - 399