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The corrosion behavior of metals and alloys at high temperatures in complex multi-oxidant environments is of a great interest for achieving extended service performances and improved operation efficiencies. In this basic study, the scaling reactions of pure chromium in several multi-oxidant gas mixtures were assessed. The environments studied are similar to those that exist in low-NOx burner and coal...
We describe a new delayering solution for semiconductor quality control and failure analyses using low-energy, broad-beam argon ion milling. The results show a large, delayered area, suitable for high resolution scanning electron microscopy (SEM) investigation and energy dispersive X-ray spectroscopy (EDS) characterization. The technique allows full top-down deprocessing, layer by layer, of three-dimensional...
We describe a new delayering solution for semiconductor quality control and failure analyses using low-energy, broad-beam argon ion milling. The results show a large, delayered area, suitable for high resolution scanning electron microscopy (SEM) investigation and energy dispersive X-ray spectroscopy (EDS) characterization. The technique allows full top-down deprocessing, layer by layer, of three-dimensional...
The X 2 holder enables the effective production of thin, electron transparent samples for high-resolution transmission electron microscopy (HRTEM). Improvements to the X 2 holder for high-quality transmission electron microscopy (TEM) sample preparation are presented in this paper. We discuss the influence of backscattered electrons (BSE) from the sample holder in determining the lamella...
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