Search results for: S. Chevtchenko
Microelectronics Reliability > 2010 > 50 > 12 > 2090-2092
Journal of Electronic Materials > 2007 > 36 > 4 > 483-487
Journal of Electronic Materials > 2006 > 35 > 4 > 550-555
Microelectronics Reliability > 2010 > 50 > 12 > 2090-2092
Journal of Electronic Materials > 2007 > 36 > 4 > 483-487
Journal of Electronic Materials > 2006 > 35 > 4 > 550-555