Search results for: Dae-Chul Ahn
IEEE Electron Device Letters > 2017 > 38 > 1 > 40 - 43
2016 IEEE International Electron Devices Meeting (IEDM) > 5.2.1 - 5.2.4
IEEE Electron Device Letters > 2017 > 38 > 1 > 40 - 43
2016 IEEE International Electron Devices Meeting (IEDM) > 5.2.1 - 5.2.4