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We describe a test carried out by using a two-thickness interferometer to investigate the effect of the surface stress on the measurement of the silicon lattice constant.
In 2011, the first determination of the Avogadro constant with Si material was published with an overall relative uncertainty of . The results were based on measurements of a very pure single crystal of highly enriched silicon-28. Where the result of crystal properties, molar mass, and lattice constant could be performed with satisfying uncertainty, the measurements on the spheres...
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