Search results for: T. Chiarella
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1084 - 1087
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
2013 IEEE International Electron Devices Meeting > 20.6.1 - 20.6.4
2012 International Electron Devices Meeting > 18.4.1 - 18.4.4
2012 International Electron Devices Meeting > 18.2.1 - 18.2.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.4.1 - 5A.4.6
2010 International Electron Devices Meeting > 10.4.1 - 10.4.4
2010 International Electron Devices Meeting > 10.6.1 - 10.6.4