Search results for: A. Spessot
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-4.1 - CR-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-7.1 - CR-7.6
2016 IEEE International Electron Devices Meeting (IEDM) > 15.3.1 - 15.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 15.6.1 - 15.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 28.2.1 - 28.2.4
Materials Science in Semiconductor Processing > 2016 > 42 > Part 2 > 255-258
2014 IEEE International Electron Devices Meeting > 32.3.1 - 32.3.4
Microelectronic Engineering > 2014 > 120 > Complete > 157-162
Microelectronic Engineering > 2013 > 109 > Complete > 314-317
Solid State Electronics > 2013 > 84 > Complete > 22-27