Search results for: Masaki Hashizume
Journal of Electronic Testing > 2018 > 34 > 5 > 559-570
Journal of Electronic Testing > 2018 > 34 > 4 > 435-446
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2726 - 2734
2015 International 3D Systems Integration Conference (3DIC) > TS8.22.1 - TS8.22.5
2015 International 3D Systems Integration Conference (3DIC) > TS8.24.1 - TS8.24.4
2015 International 3D Systems Integration Conference (3DIC) > TS8.19.1 - TS8.19.6
IEEE Transactions on Computers > 2015 > 64 > 5 > 1230 - 1240