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The possibility to simultaneously determine the thickness and the conductivity of thin semiconductor layer and the mobility of its free charge carriers by use of microwave photonic crystal with small number of its constituent elements has been shown. The results of the determination of semiconductor epitaxial layer parameters by the inverse problem solving using reflection and transmission spectra...
The possibility to simultaneously determine the thickness and the electrical conductivity of thin semiconductor layer and the mobility of its free charge carriers has been shown. The semiconductor layer plays a role of the irregularity in the one-dimensional waveguide photonic crystals. The results of the determination of highly doped semiconductor epitaxial layer parameters by the inverse problem...
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