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We compare performance of the multiline through-reflect-line and the multi-reflect through technique in the calibration of a 220-325 GHz vector-network-analyzer with WR-03 rectangular-waveguide test-ports. Both techniques employ multiple uniform-waveguide sections with unknown propagation constant and different lengths which are used either as two-port or - after terminating with an unknown reflect...
We study the performance of the multiline through-reflect-line method in the calibration of a 220-325 GHz vector-network-analyzer with WR-03 rectangular-waveguide test-ports. The calibration method is based on multiple uniform-waveguide sections with unknown propagation constant and different lengths, a reflect standard which is assumed to be identical on both vector-network-analyzer ports but otherwise...
We present an extension of the coaxial multiline through-reflect-line calibration method which allows to correct for line length errors and center-conductor-gap variation. Our approach is based on the multi-frequency formulation of the vector-network-analyzer calibration problem which accounts for the physical relationships between calibration standard S-parameters at different frequencies. We illustrate...
We present measurements demonstrating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network-analyzer calibrations with a single computer-controlled electronic verification artifact. The new system presents verification results in easy-to-understand...
The National Institute of Standards and Technology (NIST) recently introduced a new electronic approach for verifying microwave vector- network-analyzer (VNA) calibrations with a single computer-controlled electronic verification artifact. The verification results are captured in easy-to-understand performance metrics that, unlike those derived from measurements of mechanical verification artifacts,...
We present a technique for characterizing and modeling random vector network analyzer measurement errors. These errors manifest themselves as random changes or drift of vector network analyzer calibration coefficients. We model a change of calibration coefficients as a set of small electrically lumped perturbations occurring at different locations in the vector network analyzer. We then use measurements...
We present a statistical technique for one-port vector network analyzer (VNA) calibration based on multiple reflect and a single reference standards. The multiple reflect standards are assumed to be partly unknown and of the same type, e.g. offset terminations. Their reflection coefficients are modeled over frequency and identified during the calibration along with the VNA error terms. This novel...
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