Search results for: Yueh Chin Lin
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 621 - 628
Solid State Electronics > 2002 > 46 > 12 > 2085-2088
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 621 - 628
Solid State Electronics > 2002 > 46 > 12 > 2085-2088