Search results for: X. Zhang
IEEE Electron Device Letters > 2017 > 38 > 12 > 1724 - 1727
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2122 - 2128
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 285 - 292
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2951 - 2958
2013 IEEE International Reliability Physics Symposium (IRPS) > SE.8.1 - SE.8.6
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4399 - 4404
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4476 - 4482
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4483 - 4487
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2966 - 2973