Search results for: K. Esmark
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 411 - 418
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) > 6A.3-1 - 6A.3-10
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) > 6A.1-1 - 6A.1-10
Microelectronics Reliability > 2005 > 45 > 2 > 313-321
Microelectronics Reliability > 2005 > 45 > 2 > 269-277
Microelectronics Reliability > 2005 > 45 > 2 > 297-304
Journal of Electrostatics > 2004 > 62 > 2-3 > 133-153
Journal of Electrostatics > 2003 > 59 > 3-4 > 241-255
Microelectronics Reliability > 2003 > 43 > 7 > 1001-1010