The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper presents a study using alpha- and neutron-accelerated tests to characterize the soft error rate (SER) of flip-flops (FFs) that are used in 90-nm CMOS production designs. The investigated FFs differ in circuit schematic, threshold voltage (VT), drive strength, and cell height. Both the alpha- and the neutron-induced SER of FFs on a dedicated 90-nm test chip showed a strong dependence on...
This paper presents a study using alpha- and neutron-accelerated tests to characterize soft error rates (SER) of flip-flops that are used in 90-nm CMOS production designs. The investigated flip-flops differ in circuit schematic, VT, drive strength, and cell height. Both the alpha- and the neutron-induced SER of flip-flops on a dedicated 90-nm test-chip showed a strong dependency on clock and data...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.