Search results for: O. Faynot
Microelectronics Reliability > 2017 > 79 > C > 111-118
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-4.1 - 3E-4.6
2016 IEEE International Electron Devices Meeting (IEDM) > 17.6.1 - 17.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 32.6.1 - 32.6.4
Solid-State Electronics > 2016 > 125 > C > 175-181
Microelectronics Reliability > 2016 > 63 > C > 1-10
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Physics of Modern SemOI Devices > 155-168
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2015 > 365 > PB > 631-635
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-3 > 1226 - 1232
Solid State Electronics > 2015 > 108 > Complete > 36-41