Wyniki wyszukiwania dla: J. Chen
Microelectronics Reliability > 2016 > 60 > C > 16-19
IEEE Electron Device Letters > 2015 > 36 > 4 > 318 - 320
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 762 - 768
IEEE Electron Device Letters > 2013 > 34 > 1 > 30 - 32
IEEE Electron Device Letters > 2012 > 33 > 10 > 1444 - 1446
IEEE Electron Device Letters > 2012 > 33 > 3 > 354 - 356
physica status solidi c > 8 > 7‐8 > 2200 - 2203
IEEE Electron Device Letters > 2010 > 31 > 12 > 1386 - 1388
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 3186 - 3189