Search results for: Lev M. Sambursky
Microelectronics Reliability > 2017 > 79 > C > 416-425
Journal of Electronic Testing > 2017 > 33 > 1 > 37-51
2016 17th Latin-American Test Symposium (LATS) > 117 - 122
Microelectronics Reliability > 2017 > 79 > C > 416-425
Journal of Electronic Testing > 2017 > 33 > 1 > 37-51
2016 17th Latin-American Test Symposium (LATS) > 117 - 122