Search results for: Y. Liu
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.4.1 - 4C.4.4
IEEE Electron Device Letters > 2011 > 32 > 5 > 605 - 607
IEEE Electron Device Letters > 2010 > 31 > 10 > 1101 - 1103