Search results for: J. L. Rouvière
Solid-State Electronics > 2016 > 125 > C > 175-181
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Wide Band-Gap Nitrides > 3-12
Journal of Microscopy > 262 > 2 > 178 - 182
2014 IEEE International Electron Devices Meeting > 20.5.1 - 20.5.4
Microelectronic Engineering > 2013 > 106 > Complete > 168-171
physica status solidi (a) > 209 > 2 > 262 - 265
Ultramicroscopy > 1996 > 62 > 3 > 171-189