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Grazing-exit electron probe microanalysis (GE-EPMA) was performed for single Al 2 O 3 and atmospheric particles, deposited on a flat Si substrate coated by gold, by using an aperture (1 mm in diameter) in front of an energy-dispersive X-ray detector. Silicon Kα X-rays from the Si substrate were strongly observed at an exit angle of ∼45°. However, they disappeared at grazing-exit angles...
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