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Impedance spectroscopy at temperatures from 350 to 700 o C and analytical electron microscopy were used to characterize grain boundary conductivity and grain boundary segregation of SiO 2 in 8 mol% yttrium stabilized zirconia (Y-CSZ). Colloidal silica in the amount of 1-10 wt.% (2.5-25 vol.%) was added as an intergranular phase. Various grain sizes were produced by sintering or annealing...
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