Search results for: Chandan Kumar Sarkar
Microelectronics Reliability > 2007 > 47 > 6 > 953-958
Microelectronic Engineering > 2007 > 84 > 4 > 653-662
IEEE Transactions on Electron Devices > 2007 > 54 > 2 > 241 - 248
Microelectronics Reliability > 2007 > 47 > 6 > 953-958
Microelectronic Engineering > 2007 > 84 > 4 > 653-662
IEEE Transactions on Electron Devices > 2007 > 54 > 2 > 241 - 248