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This paper presents a unified test data compression approach, which simultaneously reduces test data volume, scan power consumption and test application time for a system-on-a-chip (SoC). The proposed approach is based on the use of alternating variable run-length (AVR) codes for test data compression. A formal analysis of scan power consumption and test application time is presented. The analysis...
This paper presents a new test data compression method which simultaneously reduces test data volume, test application time and test power for system-on-a-chip (SoC). The proposed approach is based on the use of alternating variable run-length code and the decompression architecture is also presented. For data streams that are composed of both runs of 0's and runs of 1's, alternating run-length codes...
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