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A new femtosecond correlation nonlinear optical profilometer with micron spatial resolution is proposed, in order to increase the measurement accuracy of the heterogeneity profile of a surface at a distance up to 1 km. The principle of operation of this profilometer is based on determining the distance to the scanned object by measuring the time interval between sequences of the base (probing) and...
A new nonlinear optical laser surface profilometer with micron surface resolution is considered. It is shown that with a resolution of the spectrometer of 0.23 nm the spatial resolution of the proposed method may reach 22.5 μm.
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