Search results for: Wei Cheng
Microelectronics Reliability > 2016 > 60 > C > 20-24
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 2-1 > 367 - 373
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1049 - 1055
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 3 > 1327 - 1337
IEEE Journal of Solid-State Circuits > 2013 > 48 > 2 > 358 - 368
IEEE Journal of Solid-State Circuits > 2013 > 48 > 10 > 2390 - 2402
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 10 > 2340 - 2353