Search results for: Hideo Fujiwara
IEEE Transactions on Computers > 2016 > 65 > 9 > 2767 - 2779
Lecture Notes in Computer Science > Graph Drawing > Papers > 183-197
Journal of Electronic Testing > 2015 > 31 > 3 > 321-327
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 11 > 1951 - 1959
Journal of Electronic Testing > 2012 > 28 > 4 > 511-521
2011 Sixteenth IEEE European Test Symposium > 147 - 152
Journal of Electronic Testing > 2011 > 27 > 2 > 99-108
Journal of Electronic Testing > 2011 > 27 > 5 > 583-598